首页> 外文会议>Solid State Device Research Conference, 1995. ESSDERC '95 >A New Lateral Insulated Gate Bipolar Transistor Structure with Improved Electrical Characteristics
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A New Lateral Insulated Gate Bipolar Transistor Structure with Improved Electrical Characteristics

机译:具有改善的电特性的新型横向绝缘栅双极晶体管结构

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This paper is aimed at the experimental demonstration of a new LIGBT structure with enhanced latch-up characteristics for power IC applications. For this purpose, several LIGBTs have been fabricated, which allows the comparison of the electrical characteristics of the proposed structure with those of previously reported LIGBTs. The RESURFed devices show a 360 V breakdown voltage and structures with and without shorted anode have been considered. The proposed modified LIGBT does not exhibit latch-up and shows a good compromise between static and dynamic characteristics.
机译:本文旨在通过实验演示一种新型LIGBT结构,该结构具有增强的闩锁特性,适用于功率IC应用。为了这个目的,已经制造了多个LIGBT,其允许将所提出的结构的电特性与先前报道的LIGBT的电特性进行比较。 RESURFed器件显示出360 V的击穿电压,并且已经考虑了带有和不带有短路阳极的结构。所提出的改进型LIGBT不表现出闩锁,并且在静态和动态特性之间表现出良好的折衷。

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