Dislocation motion in γ-TiAl in-situ recorded in an HVEM

摘要

A special straining stage in a high-voltage electron microscope is used at elevated temperatures to record the microstructural changes of a single γ phase polycrystalline material of the composition Ti52at-%Al and to compare them with room temperature observations. The presentation of the results is concentrated onto a temperature that lies immediately below the rapid decrease of flow stress at approximately 900 K.