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Cherishing Old Knowledge, Acquiring New - Past, Present and Future of CMP Technology

机译:珍惜旧知识,获取新的,现任和未来的CMP技术

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Hitting the scene in the 1980s, CMP technology developed in line with the scaling and multi-layering of semiconductor devices, and is now deemed indispensable to the production of cutting-edge semiconductor devices. It once had a bad reputation for being a "dirty, difficult and experience dependent" process, which significantly improved later thanks to the introduction of the dry-in/dry-out concept. From that time, basically dealing with the polishing process in semiconductor production, CMP underwent various developments, including methods other than polishing. To meet planarization requirements, it has been necessary to develop three core elements simultaneously, that is, CMP equipment, consumable materials, and device integration. This paper intends to review CMP technology that has evolved along with the development of semiconductor devices, to organize various issues currently faced by CMP, and to provide a comprehensive overview of the past, present and future of planarization techniques, while referring to the commitment to assisting scaling efforts until 2020, as well as expectations of new semiconductor devices emerging after 2030.
机译:在20世纪80年代击中现场,CMP技术符合半导体器件的缩放和多层的缩放和多层技术,并且现在被视为尖端半导体器件的生产不可或缺。它曾经有一个糟糕的声誉,因为这是一种“肮脏,困难和经验”过程,这既由于引入干式/干出概念而明显改善。从那时起,基本上处理半导体生产中的抛光过程,CMP接受了各种发育,包括除抛光之外的方法。为了满足平面化要求,有必要同时开发三个核心元素,即CMP设备,消耗材料和设备集成。本文打算审查随着半导体器件的发展而发展的CMP技术,以组织目前CMP面临的各种问题,并提供平面化技术的过去,现在和未来的全面概述,同时提及承诺协助扩大措施直至2020年,以及在2030年后新的半导体器件的期望。

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