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Study of selective area growth of InGaAsP QW structure by MOCVD

机译:利用MOCVD研究InGaAsP量子阱结构的选择性区域生长。

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This work reports the dependence of the growth rate of the selectively grown multi quantum well (MQW) structure on the mask width and the mask opening using a twin stripe mask. The study is based on the vapor phase diffusion model of the re-evaporated reactant from the mask to the open area. The growth rate enhancement was found to be linearly varying with the mask width until 90 /spl mu/m for InGaAsP. The two dimensional vapor phase diffusion of the reactant species is modeled based on the fact that the reactants re-supplied from the mask surface diffuse to the opening area. We also studied, the bandgap energy shift by varying the mask width in selective MOVCD growth of InGaAsP and observed that the photoluminescence peak shifts towards the longer wavelength with wider mask width. The electroluminescence spectrum of MQW structure grown between twin tapered oxide masks shows the 375 nm 3 dB down bandwidth.
机译:该工作报告了使用双条纹掩模在掩模宽度和掩模开口上的选择性种植多量子阱(MQW)结构的生长速率的依赖性。该研究基于从掩模到开口区域的再蒸发反应物的气相扩散模型。发现生长速率增强与掩模宽度线性变化,直到InGaAsp的90 / SPL mu / m。基于从掩模表面漫射到开口区域的反应物从掩模表面重新供应的反应物,反应物种的二维气相扩散进行建模。我们还研究了带隙能量,通过改变InGaAx的选择性Movcd生长中的掩模宽度,并观察到光致发光峰值朝向更宽的掩模宽度偏移较长波长。在双锥形氧化物掩模之间生长的MQW结构的电致发光谱显示375nm 3 dB下带宽。

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