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Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination

机译:通过脉冲形状鉴别识别硅检测器中的轻电荷颗粒和重离子

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Pulse-shaped discrimination with totally depleted Si-detectors in reverse mount has been investigated and shown to be an excellent method of charged-particle identification in the energy range of /spl ap/2 to 20 AMeV. In test experiments with heavy-ion beams we obtained element identification up to Ti and isotope resolution even for elements heavier than carbon. The promising results and the simplicity of the electronics recommend this technique for applications in multidetector arrays. In particular, small and compact 4/spl pi/ Si balls with relatively low thresholds for charged-particle identification to be combined with 4/spl pi/ neutron detectors or /spl gamma/ arrays can be constructed.
机译:已经研究了在反向安装中用完全耗尽的Si探测器进行脉冲形识别,并证明是在/ spl ap / 2到20 AMeV能量范围内识别带电粒子的极好方法。在重离子束测试实验中,即使对于重于碳的元素,我们也能获得高达Ti和同位素分辨率的元素识别。令人鼓舞的结果和电子设备的简便性将该技术推荐用于多探测器阵列中。特别地,可以构造用于与4 / spl pi /中子探测器或/ splγ/阵列组合的,具有相对低的阈值的,用于带电粒子识别的较小且紧凑的4 / spl pi / Si球。

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