The analysis of electrical processes in semiconductor cadmium selenide layers, caused by the structural transformations. Possible applications

摘要

The physical conditions of functioning of sensitive elements for elastic deformation registration in microvolumes of electronic systems are analysed. The sensitive element is a semiconductor polycrystalline film containing crystallites of a two phase structure of (/spl alpha/+/spl beta/)CdSe. Considerable mechanical tensions arise at the intergrain boundary of the said /spl alpha/ and /spl beta/ crystallites. The results of that can be registered electrically in the form of the sharp change of current (equilibrium conductivity) in the circuit containing the sensitive element.