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Plasma enhanced chemical vapor deposition of high refractive index polymer films

机译:等离子增强化学气相沉积高折射率聚合物薄膜

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摘要

The refractive index is a key characteristic of polymer materials in optical applications. For organic polymers, typical refractive indices are in the range of 1.35 to 1.65. Extending the refractive index beyond the limits is of fundamental scientific interest and would enhance the utility of polymers in many applications. Polymeric thin films fabricated by plasma enhanced chemical vapor deposition (PECVD) have been investigated in the fields of electronics and optics and their utility is becoming more widespread in a variety of applications. Outstanding attributes of the PECVD photonic films include a smooth surface, dense crosslinking structure, robustness, environmental resistance, optical transparency in either visible or IR regions, and good adhesion to many optical window and substrate materials. In recent years, our laboratory has fabricated novel polymer optical coatings and films by PECVD. One focus of this research has been to expand the achievable maximum refractive index. This goal has been sought using two approaches including increasing the conjugation and crosslinking of chemical moieties of the bulk film and incorporation of metal ions into the structure. The techniques of XPS, FTIR, HRSEM, and ellipsometry were used to characterize both the optical properties and the chemical structure of plasma polymerized benzene, ferrocene, and metal-phthalocyanine thin films. The structure-property relationship and the effect of PECVD processing conditions are also discussed in this presentation.
机译:折射率是光学应用中聚合物材料的关键特性。对于有机聚合物,典型的折射率在1.35至1.65的范围内。将折射率扩展到极限之外是基本的科学兴趣,并且将提高聚合物在许多应用中的效用。通过等离子体增强化学气相沉积(PECVD)制造的聚合物薄膜已经在电子和光学领域进行了研究,其实用性在各种应用中变得越来越广泛。 PECVD光子膜的突出特性包括光滑的表面,致密的交联结构,坚固性,耐环境性,可见光或IR区域的光学透明性以及对许多光学窗口和基材的良好粘合性。近年来,我们的实验室通过PECVD制备了新颖的聚合物光学涂层和薄膜。这项研究的重点是扩大可达到的最大折射率。使用两种方法来寻求该目标,包括增加本体膜的化学部分的共轭和交联以及将金属离子结合到结构中。 XPS,FTIR,HRSEM和椭偏仪技术用于表征等离子体聚合的苯,二茂铁和金属酞菁薄膜的光学性质和化学结构。在此演示文稿中还讨论了结构属性关系和PECVD处理条件的影响。

著录项

  • 来源
  • 会议地点 San Diego CA(US)
  • 作者单位

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH UES, Inc., 4401 Dayton-Xenia Rd., Dayton, OH 45432;

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH General Dynamic Information Technology, 5100 Springfield PK., Dayton, OH 45431;

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH;

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH Research Institute, University of Dayton, Dayton, OH 45469;

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH ATT Government Solutions, 2940 Presidential Dr., Ste. 390, Fairborn, OH 45324;

    Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH;

    Air Force Research Laboratory, Materials;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 TB342;
  • 关键词

    PECVD; index of refraction; plasma; photonic thin film;

    机译:PECVD;折射率;等离子体;光子薄膜;

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