首页> 外文会议>第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)论文集 >The Research on Parameters Measurement Method of Piezoelectric Thick Film Used to SAW Gas Sensor Based on MEMS Technology
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The Research on Parameters Measurement Method of Piezoelectric Thick Film Used to SAW Gas Sensor Based on MEMS Technology

机译:基于MEMS技术的声表面波气体传感器压电厚膜参数测量方法研究

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摘要

A structure of SAW gas sensor based on the PZT film is provided, on which includes input interdigital transducers, output interdigital detector and gas sensing films. The PZT piezoelectric thick film is fabricated on the structure of Au/Cr/SiO2/Si multilayer membrane. The piezoelectric parameters measurement method of the thick film are investigated systematically, i.e., the electric hysteresis loop, the dielectric constant, piezoelectric constants and the thickness of PZT thick film. The measurement results for the maximal piezoelectric constant d"33 is 201pC/N at thickness of 4μm, and the average of dielectric constant εr is 1080. The remanent polarization and the coercive field are up to 60μC/cm2 and 23kV/cm at 25V, respectively.
机译:提供了一种基于PZT膜的声表面波气体传感器的结构,其上包括输入叉指换能器,输出叉指检测器和气体传感膜。在Au / Cr / SiO2 / Si多层膜的结构上制备了PZT压电厚膜。系统地研究了厚膜的压电参数测量方法,即电滞回线,介电常数,压电常数和PZT厚膜的厚度。在厚度为4μm时,最大压电常数d“ 33的测量结果为201pC / N,介电常数εr的平均值为1080。在25V时,剩余极化和矫顽场分别高达60μC/ cm2和23kV / cm,分别。

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