X-Ray Scattering by Antiphase Ferroelectric Domain Walls in the Antiferroelectric Phase of the PbZr_(0.985)Ti_(0.015)O_3

摘要

The results of the X-ray diffuse scattering (DS) measurements of the Zr-rich PbZrO_3 - PbTiO_3 solid solution PbZr_(0.985)Ti_(0.015)O_3 (PZT1.5) are presented. Measurements were performed in zero electric field and in applied electric field E = 5 kV/cm. In the antiferroelectric phase diffuse scattering streaks around Σ superstructure peaks (h + 1/4 + 1/4 l) were found and interpreted as a scattering on ferroelectric antiphase domain walls. This conclusion is corroborated by the observation of a strong influence of the electric field on these streaks. Reported results are important for the prospective application of the antiferroelectrics as the basis for the high-density non-volatile memory devices.