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Studies on development of lead free solder alloy made by mechanical alloying

机译:机械合金化无铅钎料合金的研制研究

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Practically all-conventional microelectronic assemblies use Sn-Pb solders for interconnection. With the advent of the microchip scale packaging technologies, the usage of solder interconnection has increased. The most commonly used Sn-Pb solder has a eutectic composition. However, with increasing environmental awareness use of Pb in solder has come under the threat of environmental regulations, due to inherent toxicity of Pb. The development of Pb free solder for microelectronic applications has become a major field of research in the interconnection materials. The present investigation is concerned with an alloy system consisting of Sn-Ag-Bi along with elements, made by mechanical alloying technique. The alloy thus formed was characterised by X-ray Diffraction (XRD), Differential Scanning calorimetry (DSC), Scanning electron microscopy (SEM) and Inductive coupled plasma- Atomic emission spectroscopy (ICP-AES). Solderability testing was performed on alloy to find contact angle and area of spreading. The solder/substrate interface was characterised by SEM/ EDAX. The results of mechanically alloyed solder were compared with atomised lead free solder powder.
机译:几乎所有常规的微电子组件都使用Sn-Pb焊料进行互连。随着微芯片规模封装技术的出现,焊料互连的使用量增加了。最常用的Sn-Pb焊料具有低共熔成分。然而,随着环境意识的增强,由于铅的固有毒性,在焊料中使用铅已受到环境法规的威胁。用于微电子应用的无铅焊料的开发已经成为互连材料研究的主要领域。本研究涉及通过机械合金化技术制成的由Sn-Ag-Bi和元素组成的合金体系。由此形成的合金通过X射线衍射(XRD),差示扫描量热法(DSC),扫描电子显微镜(SEM)和电感耦合等离子体原子发射光谱法(ICP-AES)来表征。在合金上进行了可焊性测试,以发现接触角和扩展区域。焊料/基底界面通过SEM / EDAX表征。将机械合金化焊料的结果与雾化无铅焊料粉末进行了比较。

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