首页> 外文会议>International Conference on Solid-State and Integrated Circuit Technology(ICSICT-2006); 20061023-26; Shanghai(CN) >Optical Characteristics of Nano-crystalline Diamond Films as X-ray Lithography Masks for Integrated Circuit Fabrication
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Optical Characteristics of Nano-crystalline Diamond Films as X-ray Lithography Masks for Integrated Circuit Fabrication

机译:纳米晶金刚石薄膜作为X射线光刻掩模的光学特性,用于集成电路制造

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摘要

In this paper, the structure, morphology and optical properties of nano-crystalline diamond (NCD) films, deposited by hot-filament chemical vapor deposition (HFCVD) method under different carbon concentration, are investigated. With increasing the carbon concentration during the film deposition, the diamond grain size is reduced and thus a smooth diamond film can be obtained. According to the data on the absorption coefficient in the wavelength range from 200 to 1100nm, the optical gap of the NCD films decreases from 4.3 eV to 3.2eV with increasing the carbon concentration from 2.0% to 3.0 %.
机译:本文研究了在不同碳浓度下通过热丝化学气相沉积(HFCVD)方法沉积的纳米晶金刚石(NCD)薄膜的结构,形貌和光学性质。随着膜沉积期间碳浓度的增加,金刚石晶粒尺寸减小,因此可以获得平滑的金刚石膜。根据在200至1100nm波长范围内的吸收系数数据,随着碳浓度从2.0%增加到3.0%,NCD膜的光学间隙从4.3 eV减小到3.2eV。

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