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The Effect of CMP conditioner design

机译:CMP调理剂设计的效果

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Mitsubishi Materials Corporation (MMC) is producing many kinds of CMP conditioners (Fig.1) for several kinds of CMP equipment. In our long history of Ni plated CMP conditioner, our main stream was dot designed conditioner (Fig.2) by the blocky diamond. The reason to use the blocky diamond is mainly to reduce the number of the defect on the wafer. Our dot designed CMP conditioners are used by many customers for the issue of the defect. However, some users are afraid of the use of the blocky diamond, because there is the issue of the low pad wear rate. We believe the high wafer removal rate is not caused by the high pad wear rate. We researched CMP conditioner for the high wafer removal rate by the use of the blocky diamond. We conclude we can design CMP conditioner by the use of the blocky diamond for the high wafer removal rate. The effect of CMP conditioner design may be important factor.
机译:三菱材料公司(MMC)正在为多种CMP设备生产多种CMP调理剂(图1)。在我们镀镍CMP调理剂的悠久历史中,我们的主流是由块状金刚石制成的点设计调理剂(图2)。使用块状菱形的原因主要是为了减少晶片上的缺陷数量。我们的点式CMP调理剂已被许多客户用于解决问题。然而,由于存在垫磨损率低的问题,一些使用者担心使用块状金刚石。我们相信高晶圆去除率不是由高焊盘磨损率引起的。我们通过使用块状金刚石研究了CMP调节剂,以提高晶片的去除率。我们得出结论,我们可以通过使用块状金刚石来设计CMP修整器,以实现高晶圆去除率。 CMP调理剂设计的效果可能是重要的因素。

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