Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

机译：色/球差校正30 kV透射电子显微镜的性能和应用

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来源
《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|1530-1531|共2页
会议地点 Nashville, TN(US)
作者
T. Sasaki; H. Sawada; F. Hosokawa; Y. Shimizu; T. Nakamichi; S. Yuasa; M. Kawazoe; T. Kaneyama; Y. Kondo; K. Kimoto; K. Suenaga;
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JEOL Ltd. 3-1-2 Musashino Akishima Tokyo 196-8558 Japan;

National Institute for Materials Science (NIMS) 1-1 Namiki Tsukuba Ibaraki 305-0044 Japan;

Nanotube Research Center National Institute of Advanced Industrial Science and Technology (AIST) Central 5 1-1-1 Higashi Tsukuba Ibaraki 305-8565 Japan;

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1. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. [J] . Sawada H, Tanishiro Y, Ohashi Journal of Electron Microscopy . 2009,第6期

机译：用300 kV冷场发射枪通过球差校正电子显微镜对47 pm分离的原子柱进行STEM成像。
2. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun [J] . Hidetaka Sawada12* Yasumasa Tanishiro13 Nobuhiro Ohashi3 Takeshi Tomita12 Fumio Hosokawa12 Toshikatsu Kaneyama12 Yukihito Kondo12 and Kunio Takayanagi13 Journal of Electron Microscopy . 2009,第6期

机译：用300 kV冷场发射枪通过球差校正电子显微镜对47 pm分离的原子柱进行STEM成像
3. First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope [J] . T. Walther, E. Quandt, H. Stegmann Ultramicroscopy . 2006,第11a12期

机译：新型单色和像差校正的200 kV场发射扫描透射电子显微镜的首次实验测试
4. 300kV Performance of a 10k x 10k Scintillator- and Fiber-Coupled CCD Camera for Transmission Electron Microscopes [C] . B. C. Lee, B. Mollon, P. E. Mooney Microscopy and microanalysis.;Microscopy and microanalysis. . -1

机译：用于透射电子显微镜的10k x 10k闪烁体和光纤耦合CCD相机的300kV性能
5. Three-dimensional imaging in an aberration-corrected scanning transmission electron microscope [D] . Xin, Huolin. 2011

机译：像差校正扫描透射电子显微镜中的三维成像
6. The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration-Corrected Environmental Transmission Electron Microscope [O] . Robert Sinclair, Paul Joseph Kempen, Richard Chin, -1

机译：斯坦福大学纳米表征实验室（SNL）和像差校正环境透射电子显微镜的最新应用
7. Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope [O] . T Sasaki, H Sawada, F Hosokawa, 2011

机译：色/球面像差校正30 kV透射电子显微镜的性能与应用

Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

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