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Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

机译：色/球面像差校正30 kV透射电子显微镜的性能与应用

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T Sasaki; H Sawada; F Hosokawa; Y Shimizu; T Nakamichi; S Yuasa; M Kawazoe; T Kaneyama; Y Kondo; K Kimoto; K Suenaga;
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年度 2011
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1. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. [J] . Sawada H, Tanishiro Y, Ohashi Journal of Electron Microscopy . 2009,第6期

机译：用300 kV冷场发射枪通过球差校正电子显微镜对47 pm分离的原子柱进行STEM成像。
2. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun [J] . Hidetaka Sawada12* Yasumasa Tanishiro13 Nobuhiro Ohashi3 Takeshi Tomita12 Fumio Hosokawa12 Toshikatsu Kaneyama12 Yukihito Kondo12 and Kunio Takayanagi13 Journal of Electron Microscopy . 2009,第6期

机译：用300 kV冷场发射枪通过球差校正电子显微镜对47 pm分离的原子柱进行STEM成像
3. First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope [J] . T. Walther, E. Quandt, H. Stegmann Ultramicroscopy . 2006,第11a12期

机译：新型单色和像差校正的200 kV场发射扫描透射电子显微镜的首次实验测试
4. Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope [C] . T. Sasaki, H. Sawada, F. Hosokawa, International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting . 2011

机译：色/球差校正30 kV透射电子显微镜的性能和应用
5. Three-dimensional imaging in an aberration-corrected scanning transmission electron microscope [D] . Xin, Huolin. 2011

机译：像差校正扫描透射电子显微镜中的三维成像
6. The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration-Corrected Environmental Transmission Electron Microscope [O] . Robert Sinclair, Paul Joseph Kempen, Richard Chin, -1

机译：斯坦福大学纳米表征实验室（SNL）和像差校正环境透射电子显微镜的最新应用
7. Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy [O] . Ute Kaiser 2016

机译：球形和色差校正低压高分辨率透射电子显微镜和光谱法测量低维电子射线敏感物体的性能

Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

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