Microscopic description of exciton-polaritons in thinsemiconductor layers

摘要

Polariton effects in the optical spectra of thin semiconductor samples are analyzedwithin a microscopic theory based on a direct solution of the Schr¨odinger equation for theexciton motion in a finite sample. Results are compared with the Pekar model augmentedby phenomenologically introduced dead-layers at the surfaces. While the dead-layer is anunknown input parameter for macroscopic models based on additional boundary conditions,the microscopic theory can be used to determine the dead-layer thickness. Calculations arepresented for various material systems.