Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, via Ponzio 34/5, 20133 Milano Italy,Dept. of Telecommunications Engineering, Mehran University of Engineering Technology, Jamshoro 76062, Pakistan;
Dept. of Telecommunications Engineering, Mehran University of Engineering Technology, Jamshoro 76062, Pakistan;
Polifab, Politecnico di Milano, via Giuseppe Colombo 81, 20133 Milano Italy;
Polifab, Politecnico di Milano, via Giuseppe Colombo 81, 20133 Milano Italy;
Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, via Ponzio 34/5, 20133 Milano Italy;
Silicon oxycarbide; spectroscopic ellispometry; thin films; optical materials; optical waveguides; integrated optics; rf sputtering;
机译:基于悬崖 - 储存电子显微镜(茎)定量X射线微基分析硅氧化硅薄膜的扫描液体显微镜(茎)薄膜的比较
机译:射频溅射沉积SiC薄膜表面形成的碳氧化硅的XPS分析
机译:通过远程氢微波等离子体CVD形成的碳化硅,碳氮化硅和氧化硅氧化硅薄膜
机译:氧化硅薄膜和波导的实验分析
机译:通过四氢化硅-二氧化碳-乙烯混合物的氧碳化来化学气相沉积碳氧化硅薄膜。
机译:氮掺杂对非晶碳氧化硅薄膜光致发光的影响
机译:用氧化铝薄膜涂层在硅条波导中进行实验验证的分散剪裁
机译:薄膜波导传播衰减对光学薄膜的影响。 2.实验分析