首页> 外文会议>Institute of Physics Electron Microscopy and Analysis Group Conference, Sep 5-7, 2001, Dundee >Electronic structure of GaN studied with electron energy loss spectroscopy and density functional theory
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Electronic structure of GaN studied with electron energy loss spectroscopy and density functional theory

机译:用电子能量损失谱和密度泛函理论研究GaN的电子结构

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摘要

The Electron Energy Loss Near -Edge Structure (ELNES) is related to a site- and symmetry-projected, unoccupied density of states (DOS). Therefore, it contains information about the electronic structure and interatomic bonding of materials. In this work, GaN, an important light-emitting semiconductor, is studied. Experimental spectra are compared to theoretical spectra, based on a calculation of the DOS, and excellent agreement is observed when the effects of the core-hole are included. The anisotropy of the electronic structure is also investigated and a discussion of the nature of the bonding in GaN is given.
机译:电子能量损失近边缘结构(ELNES)与位置和对称投影的未占用状态密度(DOS)有关。因此,它包含有关材料的电子结构和原子间键合的信息。在这项工作中,研究了重要的发光半导体GaN。基于DOS的计算,将实验光谱与理论光谱进行比较,并且当包括芯孔的影响时,可以观察到极好的一致性。还研究了电子结构的各向异性,并讨论了GaN中键合的性质。

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