High-performance 30 TDI scan reversible MWIR InSb hybrid scanning array with on-focal-plane dynamic-range compression

摘要

Abstract: This paper details a high performance MWIR scanning array with 30 time delay and integration stages, forward and reverse scan operation, less than 80 noise electrons per stage and on focal plane blooming control nd dynamic range and indium bumped to a VLSI/CMOS/CCD silicon readout fabricated in 1.25 micrometer CMOS with 2 poly and 3 metal interconnect levels. !0