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Power, Performance, and Area Optimization Through the Use of Semiconductor Trench Decoupling Capacitors

机译:通过使用半导体沟槽去耦电容器来优化功率,性能和面积

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摘要

Designing semiconductor products increasingly involves trade-offs in cost, power, performance, and supply noise. While geometries continue to shrink, voltages no longer scale so requirements for managing supply noise become more stringent. Traditional design approaches using oxide decoupling capacitors improve performance by reducing supply noise, but result in increased area and leakage. As an alternative to oxide decoupling capacitors, this paper explores the cost, noise reduction, and leakage advantages seen in representative IBM 90 nm and 65 nm ASIC Products through use of efficient trench decoupling capacitors.
机译:设计半导体产品越来越多地涉及到成本,功率,性能和电源噪声之间的权衡。当几何尺寸继续缩小时,电压不再成比例,因此管理电源噪声的要求变得更加严格。使用氧化物去耦电容器的传统设计方法通过降低电源噪声来提高性能,但会导致面积增大和泄漏。作为氧化物去耦电容器的替代品,本文探索了通过使用有效的沟槽去耦电容器,在具有代表性的IBM 90 nm和65 nm ASIC产品中看到的成本,噪声降低和泄漏优势。

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