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Etching Formation of GaN Micro Optoelectronic Device Array

机译:GaN微光电器件阵列的刻蚀形成

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GaN based micro emitter optoelectronic device array has been proved to be the core component for wide variety of applications such as microdisplay, biosensor, projection etc. Etching is one of the key steps to form the GaN micro emitter array device, including inductively coupled plasma (ICP) dry etch and alkaline solution wet etch. This paper reports the recent progress made by Ostendo Technologies Inc in fabricating the ultra-high density, large aspect-ratio etching formed monolithic GaN micro emitter optoelectronic device array. The unit density reaches 1M per cm2, with good uniformity across the whole wafer. Perpendicular etching sidewall was achieved, with smooth surface roughness which is significance feature used for laser diodes (LDs) device.
机译:GaN基微发射器光电器件阵列已被证明是微显示器,生物传感器,投影等多种应用的核心组件。蚀刻是形成GaN微发射器阵列器件的关键步骤之一,包括电感耦合等离子体( ICP)干蚀刻和碱性溶液湿蚀刻。本文报道了Ostendo Technologies Inc在制造超高密度,大纵横比蚀刻形成的单片GaN微发射器光电器件阵列方面的最新进展。单位密度达到每平方厘米1M,在整个晶片上具有良好的均匀性。实现了垂直蚀刻侧壁,具有平滑的表面粗糙度,这是用于激光二极管(LDs)器件的重要特征。

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