首页> 外文会议>2019 Electron Devices Technology and Manufacturing Conference >A Novel Partial Carrier Stored and Hole Path IGBT for Ultralow Turn-Off Loss and On-State Voltage With High EMI Noise Controllability
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A Novel Partial Carrier Stored and Hole Path IGBT for Ultralow Turn-Off Loss and On-State Voltage With High EMI Noise Controllability

机译:一种新型的部分载流子存储和空穴路径IGBT,具有超低的关断损耗和导通电压,具有高EMI噪声可控性

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A partial carrier stored and hole path floating dummy shield trench IGBT (PCS-FD-IGBT) is proposed and investigated by simulation. Under Eoff of 8mJ/cm2, the VCE(sat) of 1200V class PCS-FD-IGBT is 1.223V, which is 11.1% and 2.2% less than CON-FD-IGBT and HP-FD-IGBT. Besides, the EMI noise of PCS-FD-IGBT is suppressed at a lower level (dV/dt is below 80kV/μs). Moreover, the PCS-FD-IGBT improves the gate drive controllability to easily adapt the larger range of system inductance.
机译:提出并存储了部分载流子和空穴路径浮置虚拟屏蔽沟槽IGBT(PCS-FD-IGBT),并进行了仿真研究。在E \ n 关闭 \ n为8mJ / cm \ n 2 \ n,1200V级PCS-FD-IGBT的VCE(sat)为1.223V,比CON-FD-IGBT低11.1%和2.2%和HP-FD-IGBT。此外,PCS-FD-IGBT的EMI噪声被抑制在较低的水平(dV / dt低于80kV /μs)。此外,PCS-FD-IGBT改善了栅极驱动的可控性,可轻松适应更大范围的系统电感。

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