College of Opto-electronic Engineering, Chongqing University, Chongqing, 400044, China;
College of Opto-electronic Engineering, Chongqing University, Chongqing, 400044, China;
College of Opto-electronic Engineering, Chongqing University, Chongqing, 400044, China;
College of Opto-electronic Engineering, Chongqing University, Chongqing, 400044, China;
Electronic Components, Technology and Materials, Delft University of Technology, Delft, CD, 2628, The Netherlands;
College of Opto-electronic Engineering, Chongqing University, Chongqing, 400044, China;
Insulated gate bipolar transistors; Logic gates; Electromagnetic interference; Capacitance; Switches; Doping; Controllability;
机译:具有集成在场氧化物上的高压p-i-n二极管的超低关断损耗SOI-LIGBT
机译:具有沟槽栅极势垒和载流子存储层的超低关断损耗双栅极SOI LIGBT
机译:具有高k介电调制的新型IGBT实现超级关闭损耗
机译:一种新的局部载波存储和孔径IGBT,用于高EMI噪声控制性高的超级开关损耗和导通状态电压
机译:IGBT的最佳双面栅极控制,可降低关断损耗并抑制浪涌电压