【24h】

Nanocontact Epitaxy of Thin Films on Si Substrates Using Nanodot Seeds Fabricated by Ultrathin SiO_2 Film Technique

机译:利用超薄SiO_2薄膜技术制备的纳米晶种在Si衬底上薄膜的纳米接触外延

获取原文
获取原文并翻译 | 示例

摘要

We developed a new technique for heteroepitaxial growth on Si substrates, we call nanocontact epitaxy. In this technique, elastically strain-relaxed nanodots (NDs) formed by ultrathin SiO_2 film technique are used as seed crystals for film growth. Using this technique, we grew high quality Ge thin films on Si(001) substrates where there is 4% lattice mismatch. Furthermore, we succeeded in the epitaxial growth of high quality GaSb thin films on Si(001) substrates with large lattice mismatch (~12%). We observed strong photoluminescence from these thin films. This demonstrated the nanocontact epitaxy is promising as a new heteroepitaxial growth technique applicable to large lattice mismatch system.
机译:我们开发了一种在Si衬底上进行异质外延生长的新技术,称为纳米接触外延。在该技术中,通过超薄SiO_2薄膜技术形成的弹性应变松弛纳米点(NDs)被用作用于薄膜生长的籽晶。使用该技术,我们在Si(001)衬底上生长了4%晶格失配的高质量Ge薄膜。此外,我们成功地在高晶格失配(〜12%)的Si(001)衬底上外延生长了高质量的GaSb薄膜。我们从这些薄膜观察到强光致发光。这证明了纳米接触外延有望作为一种适用于大晶格失配系统的新的异质外延生长技术。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号