...
首页> 外文期刊>Thin Solid Films >Fe_3Si nanodots epitaxially grown on Si(lll) substrates using ultrathin SiO_2 film technique
【24h】

Fe_3Si nanodots epitaxially grown on Si(lll) substrates using ultrathin SiO_2 film technique

机译:利用超薄SiO_2薄膜技术外延生长在Si(III)衬底上的Fe_3Si纳米点

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Ultrahigh density (>10~(12)cm~(-2)) Fe_3Si nanodots (NDs) are epitaxially grown on Si(lll) substrates by codeposition of Fe and Si on the ultrathin SiO2 films with ultrahigh density nanovoids. We used two kinds of methods for epitaxial growth: molecular beam epitaxy (MBE) and solid phase epitaxy. For MBE, low temperature (<300 ℃) growth of the Fe_3Si NDs is needed to suppress the interdiffusion between Fe atoms deposited on the surfaces and Si atoms in the substrate. These epitaxial NDs exhibited the ferromagnetism at low temperatures, which were expected in terms of the application to the magnetic memory device materials.
机译:通过在具有超高密度纳米空隙的超薄SiO2膜上共沉积Fe和Si,在Si(III)衬底上外延生长超高密度(> 10〜(12)cm〜(-2))Fe_3Si纳米点(NDs)。我们使用两种外延生长方法:分子束外延(MBE)和固相外延。对于MBE,需要抑制Fe_3Si NDs的低温(<300℃)生长,以抑制沉积在表面的Fe原子与衬底中的Si原子之间的相互扩散。这些外延ND在低温下表现出铁磁性,这在应用于磁存储器件材料方面是期望的。

著录项

  • 来源
    《Thin Solid Films》 |2011年第24期|p.8512-8515|共4页
  • 作者单位

    Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan;

    Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan;

    Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan;

    Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    nanodots; Fe_3Si; MBE; SPE; ultrathin SiO_2 films;

    机译:纳米点Fe_3Si;MBE;SPE;SiO_2超薄薄膜;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号