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Multilayer reflectance during exposure to EUV radiation

机译:暴露于EUV辐射期间的多层反射率

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Mo/Si multilayer mirrors have been exposed to intense monochromatic EUV radiation in order to investigate a possible deterioration of the mirror reflectance under different vacuum conditions. Power densities up to 3 mW/mm~2 were applied at the PTB undulator beamline at BESSY II, applying a hydrocarbon enriched vacuum. The mirror reflectance has been monitored in situ during several hours of exposure. vacuum pressures of 3x10~(-8) mbar (without hydrocarbons) and 10~(-7) mbar (with hydrocarbons) at EUV intensities of 3 mW/mm~2, respectively 0.2 mW/mm~2 have been applied. The reflectance of the mirrors decreased when exposed to EUV radiation in hydrocarbon enriched vacuum, while no loss in reflectance was observed when no hydrocarbons were added to the vacuum.
机译:Mo / Si多层反射镜已暴露于强烈的单色EUV辐射中,以研究在不同真空条件下反射镜反射率可能会下降。在BESSY II的PTB波动器光束线上施加了高达3 mW / mm〜2的功率密度,施加了富含碳氢化合物的真空。在曝光的几个小时内已对原位镜反射率进行了监控。分别在3mW / mm〜2的EUV强度下施加了3x​​10〜(-8)mbar(不含碳氢化合物)和10〜(-7)mbar(含碳氢化合物)的真空压力,分别为0.2 mW / mm〜2。当在富含碳氢化合物的真空中暴露于EUV辐射时,反射镜的反射率降低,而在真空中未添加任何碳氢化合物时,则未观察到反射率损失。

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