首页> 外文会议>Conference Series no.184; International Symposium on Compound Semiconductors; 20040912-16; Seoul(KR) >Surface morphologies of AlGaN films and AlGaN/GaN heterostructures on vicinal sapphire (0001) substrates grown by rf-MBE
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Surface morphologies of AlGaN films and AlGaN/GaN heterostructures on vicinal sapphire (0001) substrates grown by rf-MBE

机译:通过rf-MBE生长的相邻蓝宝石(0001)衬底上的AlGaN膜和AlGaN / GaN异质结构的表面形态

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摘要

Surface morphologies of AlGaN films and AlGaN/GaN heterostructures are investigated. It is found that the surface morphologies of AlGaN are greatly improved by using vicinal substrates. Well-defined steps cover the surfaces, and micro-cracks and pinholes disappear. It is expected that the reductions of micro-cracks and pinholes connect to the high performance of electronic device such as HEMT.
机译:研究了AlGaN薄膜的表面形貌和AlGaN / GaN异质结构。发现通过使用邻近的衬底可以极大地改善AlGaN的表面形态。轮廓分明的台阶覆盖表面,微裂纹和针孔消失。可以预期的是,微裂纹和针孔的减少与诸如HEMT的电子设备的高性能有关。

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