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PERFORMANCE ANALYSIS OF HIGH-ACCURACY CMOS SAMPLE-AND-HOLD CIRCUITS

机译:高精度CMOS采样保持电路的性能分析

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摘要

This paper presents the performance analysis of different high-accuracy sample-and-hold circuit (SHC) techniques using CMOS technology. The paper begins with a detailed analysis of the major factors that limit the accuracy of a fundamental SHC. Then different techniques to implement high-accuracy SHCs are described. SHC employing transmission gate and SHC using feedback loop with compensation capacitor, as well as the fundamental SHC, were all implemented and tested and performance results demonstrate the superiority of each SHC schemes. For comparison reasons, the three SHCs were operated at a speed of 330MHz. Results indicate that an increase of accuracy of 95% is achieved and the maximum sampling speed is increased by 15% when the SHC using feedback loop is used instead of the fundamental SHC. These characteristics make this device better candidate for many applications where speed and accuracy are the major factors.
机译:本文介绍了使用CMOS技术的各种高精度采样保持电路(SHC)技术的性能分析。本文首先详细分析了限制基本SHC准确性的主要因素。然后描述了实现高精度SHC的不同技术。使用传输门的SHC和使用带补偿电容器的反馈回路的SHC以及基本SHC均已实施和测试,性能结果证明了每种SHC方案的优越性。出于比较的原因,这三个SHC以330MHz的速度运行。结果表明,使用反馈回路的SHC代替基本SHC时,可实现95%的精度提高,最大采样速度提高15%。这些特性使该器件更适合许多以速度和精度为主要因素的应用。

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