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Uniform Derandomization from Pathetic Lower Bounds

机译:从可怜的下界均匀去随机化

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摘要

A recurring theme in the literature on derandomization is that probabilistic algorithms can be simulated quickly by deterministic algorithms, if one can obtain impressive (i.e., superpolynomial, or even nearly-exponential) circuit size lower bounds for certain problems. In contrast to what is needed for derandomization, existing lower bounds seem rather pathetic (linear-size lower bounds for general circuits [30], nearly cubic lower bounds for formula size [23], nearly n log log n size lower bounds for branching programs [12], n~(1+c_d) for depth d threshold circuits [26]). Here, we present two instances where "pathetic" lower bounds of the form n_(1+∈) would suffice to derandomize interesting classes of probabilistic algorithms. We show: - If the word problem over S_5 requires constant-depth threshold circuits of size n_(1+∈) for some e > 0, then any language accepted by uniform polynomial-size probabilistic threshold circuits can be solved in subexponential time (and more strongly, can be accepted by a uniform family of deterministic constant-depth threshold circuits of subexponential size.) - If no constant-depth arithmetic circuits of size n_(1+∈) can multiply a sequence of n 3-by-3 matrices, then for every constant d, black-box identity testing for depth-d arithmetic circuits with bounded individual degree can be performed in subexponential time (and even by a uniform family of deterministic constant-depth AC~0 circuits of subexponential size). Derandomization, Circuit Complexity, Polynomial Identity Testing
机译:关于去随机化的文献中反复出现的主题是,如果可以为某些问题获得令人印象深刻的(即,超多项式,甚至接近指数的)电路尺寸下限,则可以通过确定性算法快速模拟概率算法。与非随机化所需的相反,现有的下限似乎相当可悲(通用电路的线性大小下限[30],公式大小的近似下限[23],分支程序的近似n log log n大小下限) [12],对于深度d阈值电路[26],n〜(1 + c_d)。在这里,我们给出两个实例,其中形式n_(1 +∈)的“可悲的”下界足以使概率算法的有趣类去随机化。我们证明:-如果S_5上的单词问题需要在e> 0的情况下大小为n_(1 +∈)的恒定深度阈值电路,则统一多项式大小的概率阈值电路接受的任何语言都可以在次指数时间内求解(并且-如果没有大小为n_(1 +∈)的恒定深度算术电路可以乘以n个3-by-3矩阵的序列,则可以更强地接受统一指数族的确定性恒定深度阈值电路。 ,则对于每个常数d,都可以在亚指数时间内对深度d的算术电路进行黑盒身份测试,该电路具有单个的有界度(甚至可以由亚指数大小的统一的确定性恒深度AC〜0电路族来完成)。去随机化,电路复杂度,多项式身份测试

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