DEVELOPMENT OF CALIBRATION DEVICE FOR ATOMIC FORCE MICROSCAPE

机译：原子力微囊标定装置的研制

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(1)The novel calibration device for atomic force microscopes is proposed. (2) The fundamental performances of the calibration device are confirmed in experiments.

机译：（1）提出了一种新型的原子力显微镜标定装置。（2）在实验中证实了校准装置的基本性能。

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来源
《American Society for Precision Engineering(ASPE) Annual Meeting; 20071014-19; Dallas,TX(US)》|2007年|P.324-327|共4页
会议地点 DallasTX(US)
作者
Yuta Suzuki; Satoshi Honda;
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作者单位

Department of mechanical Engineering Tokyo Metropolitan University Minami-osawa, Hachioji, Tokyo, Japan;

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原文格式 PDF
正文语种 eng
中图分类公差与技术测量及机械量仪;
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专利

1. Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC) [J] . Min-Seok Kim, Jae-Hyuk Choi, Yon-Kyu Park, Metrologia: International Journal of Scientific Metrology: = Internationale Zeitschrift fur Wissenschaftliche Metrologie: = Journal International de Metrologie Scientifique . 2006,第5期

机译：原子力显微镜悬臂校准装置，用于在微米或纳米级范围内进行定量的力计量：纳米力校准器（NFC）
2. Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance [J] . Peter J. Cumpson, John Hedley, Charles A. Clifford Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures . 2005,第5期

机译：原子力显微镜中用于横向力校准的微机电装置：横向电纳米天平
3. Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration [J] . Peter J Cumpson, Charles A Clifford, John Hedley Measurement Science & Technology . 2004,第7期

机译：定量分析原子力显微镜：悬臂参考装置，可轻松，准确地进行AFM弹簧常数校准
4. DEVELOPMENT OF CALIBRATION DEVICE FOR ATOMIC FORCE MICROSCAPE [C] . Yuta Suzuki, Satoshi Honda American Society for Precision Engineering Annual Meeting . 2007

机译：原子力微观校准装置的研制
5. Calibration of atomic force microscopes with silicon atomic step artifact. [D] . Tsai, Vincent Wen-Chieh. 1998

机译：用硅原子台阶工件校准原子力显微镜。
6. Combined atomic force microscopy and photoluminescence imaging to select single InAs/GaAs quantum dots for quantum photonic devices [O] . Luca Sapienza, Jin Liu, Jin Dong Song, -1

机译：结合原子力显微镜和光致发光成像为量子光子器件选择单个InAs / GaAs量子点
7. Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization [O] . Cannara, Rachel J, Eglin, Michael, Carpick, Robert W 2006

机译：原子力显微镜中的横向力校准：一种新的横向力校准方法和优化的一般准则
8. Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy [R] . Leever, B. J., Durstock, M. F., Irwin, M. D., 2008

机译：使用原子力光伏显微镜的空间分辨光电流映射操作有机光伏器件

DEVELOPMENT OF CALIBRATION DEVICE FOR ATOMIC FORCE MICROSCAPE

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