首页> 外文会议>Advances in Resist Technology and Processing IX >Ester degradation in the DESIRE process
【24h】

Ester degradation in the DESIRE process

机译:DESIRE工艺中的酯降解

获取原文
获取原文并翻译 | 示例

摘要

Abstract: This paper attempts to investigate the possible degradation of the ester formed in PLASMASK 200G photoresist during extended silylation times with HMDS (hexamethyldisilazane). The breakdown of the ester results in the formation of a phenolic moiety and an amide. This may lead to silylation of this newly released phenolic OH-group in the unexposed regions, and hence a decrease in the contrast might occur. This would have a detrimental effect on critical dimension (CD) control. It was found that under higher ammonia concentrations, an ester degrades to release a phenolic group and also an amide. The silylation times involved are much greater than that used in the DESIRE process, and as such degradation of the ester in the DESIRE process is itself quite minimal. It is, however, suggested that a silylating agent that does not form a base on cleavage be used instead to reduce the degradation effect. !10
机译:摘要:本文试图研究在使用HMDS(六甲基二硅氮烷)延长甲硅烷基化时间期间,PLASMASK 200G光致抗蚀剂中形成的酯可能发生的降解。酯的分解导致酚部分和酰胺的形成。这可能导致该新释放的酚羟基在未曝光区域发生甲硅烷基化,因此对比度可能会降低。这将对关键尺寸(CD)控制产生不利影响。已经发现,在较高的氨浓度下,酯降解以释放酚基以及酰胺。所涉及的甲硅烷基化时间比在DESIRE方法中使用的甲硅烷基化时间长得多,并且因此在DESIRE方法中酯的降解本身是非常小的。但是,建议改用降低裂解作用的硅烷化剂,该硅烷化剂在裂解时不形成碱基。 !10

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号