Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel;
Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel;
Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel;
Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel;
Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel ,Kinneret College on the Sea of Galilee, Israel;
Technion-Israel Institute of Technology, Department of Electrical Engineering, Haifa 32000, Israel ,Kinneret College on the Sea of Galilee, Israel;
SPAD; APD; gun muzzle; detection; CMOS;
机译:枪炮口闪光灯检测系统的无源CMOS单光子雪崩二极管成像仪
机译:高光子检测效率单光子雪崩二极管在0.18 mu m标准CMOS工艺中
机译:采用标准CMOS0.18-μM技术的全集成单光子雪崩二极管检测器
机译:枪枪口闪光检测在0.18μmCMOS技术中使用单个光子雪崩二极管阵列
机译:用于荧光寿命成像和微阵列应用的CMOS单光子雪崩二极管阵列
机译:CMOS单光子雪崩二极管的光子检测概率模拟方法
机译:CMOS 150nm技术中的单光子雪崩二极管(SPAD)阵列的串扰表征