机译:高光子检测效率单光子雪崩二极管在0.18 mu m标准CMOS工艺中
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Chongqing Univ Posts &
Telecommun Coll Elect Engn Chongqing 400065 Peoples R China;
Single photon avalanche diodes; photon detection efficiency; dark count rate; guard ring; the quantum efficiency;
机译:高光子检测效率单光子雪崩二极管在0.18 mu m标准CMOS工艺中
机译:高光子检测效率CMOS单光子雪崩二极管的设计与表征
机译:采用90 nm CMOS成像技术的单光子雪崩二极管,在690 nm处的光子检测效率为44%
机译:采用0.18 µm CMOS标准技术的64个单光子雪崩二极管阵列,具有通用的淬灭电路,可快速进行原型制作
机译:CMOS单光子雪崩二极管和微机械滤光片,用于集成荧光传感。
机译:CMOS单光子雪崩二极管的光子检测概率模拟方法
机译:采用标准SOI CMOS技术制造的首个单光子雪崩二极管,具有器件的完整特性