首页> 外文会议>Advanced Computing amp; Communication Technologies (ACCT), 2012 Second International Conference on >Flexible Discrete Software Reliability Growth Model for Distributed Environment Incorporating Two Types of Imperfect Debugging
【24h】

Flexible Discrete Software Reliability Growth Model for Distributed Environment Incorporating Two Types of Imperfect Debugging

机译:包含两种不完善调试的分布式环境的灵活离散软件可靠性增长模型

获取原文
获取原文并翻译 | 示例

摘要

In literature we have several software reliability growth models developed to monitor the reliability growth during the testing phase of the software development. These models typically use the calendar / execution time and hence are known as continuous time SRGM. However, very little seems to have been done in the literature to develop discrete SRGM. Discrete SRGM uses test cases in computer test runs as a unit of testing. Debugging process is usually imperfect because during testing all software faults are not completely removed as they are difficult to locate or new faults might be introduced. In real software development environment, the number of failures observed need not be same as the number of errors removed. If the number of failures observed is more than the number of faults removed then we have the case of imperfect debugging. Due to the complexity of the software system and the incomplete understanding of the software requirements, specifications and structure, the testing team may not be able to remove the fault perfectly on detection of the failure and the original fault may remain or get replaced by another fault. In this paper, we discuss a discrete software reliability growth model for distributed system considering imperfect debugging that faults are not always corrected/removed when they are detected and fault generation. The proposed model assumes that the software system consists of a finite number of reused and newly developed sub-systems. The reused sub-systems do not involve the effect of severity of the faults on the software reliability growth phenomenon because they stabilize over a period of time i.e. the growth is uniform whereas, the newly developed subsystem does involve. For newly developed component, it is assumed that removal process follows logistic growth curve due to the fact that learning of removal team grows as testing progresses. The fault removal phenomena for reused and newly developed sub-systems have been modeled separa-nely and are summed to obtain the total fault removal phenomenon of the software system. The model has been validated on two software data sets and it is shown that the proposed model fairs comparatively better than the existing one.
机译:在文献中,我们开发了几种软件可靠性增长模型来监视软件开发测试阶段的可靠性增长。这些模型通常使用日历/执行时间,因此称为连续时间SRGM。但是,在文献中似乎很少进行开发离散型SRGM的工作。离散SRGM在计算机测试运行中将测试用例作为测试的一个单元。调试过程通常是不完善的,因为在测试过程中,所有软件故障都无法完全消除,因为它们很难定位或可能引入新的故障。在实际的软件开发环境中,观察到的故障数量不必与消除的错误数量相同。如果观察到的故障数大于消除的故障数,则说明调试不完善。由于软件系统的复杂性以及对软件要求,规格和结构的不完全了解,测试团队可能无法在检测到故障时完美地消除故障,并且原始故障可能会保留或被其他故障替换。在本文中,我们讨论了一种用于调试不完善的离散系统的软件可靠性增长模型,该调试不完善,即当检测到故障并生成故障时,并不总是能够纠正/消除故障。提出的模型假设软件系统由有限数量的可重用和新开发的子系统组成。重用子系统不涉及故障严重性对软件可靠性增长现象的影响,因为它们在一段时间内保持稳定,即增长是均匀的,而新开发的子系统确实会涉及。对于新开发的组件,由于移除团队的学习随着测试的进行而增长,因此假设移除过程遵循逻辑增长曲线。分别对重用和新开发的子系统的故障消除现象进行了建模,并对其进行了汇总,以获得软件系统的总体故障消除现象。该模型已在两个软件数据集上进行了验证,结果表明,提出的模型比现有模型具有更好的公平性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号