University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
AMCAD Engineering, Limoges, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
University of Bordeaux, IMS Laboratory, Talence, France;
University of Limoges, XLIM Laboratory, Brive-la-Gaillarde, France;
Logic gates; Current measurement; Electron traps; Voltage measurement; Load modeling; Solid modeling; Pulse measurements;
机译:GaN MOS-HEMTS的单脉冲电荷泵测量:界面陷阱密度快速可靠地提取
机译:掺铁的AlGaN / GaN HEMT中的缓冲陷阱:基于脉冲和瞬态测量的物理性质研究
机译:实时电致发光和$ I {-} V $脉冲测量评估AlGaN / GaN HEMT的电子俘获速度
机译:通过脉冲I-V测量和相关的新陷阱模型调查GaN / A1GaN Hemts的快速和慢电荷捕获机制
机译:微观研究有机半导体中电荷的命运:扫描开尔文探针测量p型和n型器件中的电荷俘获,传输和电场
机译:二维电子气上的供体样表面陷阱以及AlGaN / GaN HEMT的电流崩塌
机译:栅极漏电流对alGaN / GaN HEmT的影响由低频噪声和脉冲电测量证明,栅极漏电流对alGaN / GaN HEmT的影响由脉冲I-V和低频噪声测量证明
机译:考虑陷阱和热效应的GaN / alGaN HEmT E类功率放大器设计。