Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Temasek Laboratories@NTU, Nanyang Technological University, 50 Nanyang Drive, 637553, Singapore;
Random access memory; Transistors; Microcontrollers; Probes; Laser applications; Standards;
机译:激光打桩解扰的交互式无损验证
机译:利用激光诱导的外延c-Si生长技术制造的500MHz DDR高性能72Mb 3-D SRAM,用于独立和嵌入式存储器应用
机译:嵌入式SRAM的相邻MBU容错SEC-DED-TAEC-yAED代码
机译:使用激光探头的嵌入式SRAM的解扰
机译:嵌入式SRAM的时间驱动测试方法。
机译:使用扫描探针显微镜和分子动力学探测C84嵌入的Si衬底
机译:用于物理不可克隆功能的微控制器嵌入式SRAM的分析