University of Notre Dame, 275 Fitzpatrick Hall, Notre Dame, IN, 46556, USA;
University of Notre Dame, 275 Fitzpatrick Hall, Notre Dame, IN, 46556, USA;
Qorvo, 500 W. Renner Rd., Richardson, TX, 75080, USA;
Qorvo, 500 W. Renner Rd., Richardson, TX, 75080, USA;
MicroLink Devices., 6457 W. Howard St., Niles, IL, 60714, USA;
MicroLink Devices., 6457 W. Howard St., Niles, IL, 60714, USA;
Virgina Tech, 302 Whittemore, Blacksburg, VA, 24061, USA;
University of Notre Dame, 275 Fitzpatrick Hall, Notre Dame, IN, 46556, USA;
Gallium nitride; Substrates; Current density; Scalability; Electric fields; High-voltage techniques;
机译:具有高雪崩能力的4.9 kV击穿电压垂直GaN p-n结二极管
机译:4.9 kV击穿电压垂直GaN P-n结二极管具有高雪崩功能
机译:5.0 kV击穿电压垂直GaN p-n结二极管
机译:具有10个正向电流的垂直GaN-On-GaN P-N二极管和1.6 kV击穿电压
机译:垂直GaN P-N二极管中的缺陷介导的载波传输机制
机译:基于P型伪垂直金刚石肖特基势垒二极管正向电流-电压特性的迁移模型
机译:具有改进的MESA结构的高击穿电压垂直GaN-On-GaN P-I-N二极管的研究