Tutorial I: Topic: Automotive test strategies

摘要

Given today's fast growing automotive semiconductor industry, this tutorial will discuss the implications of automotive test, reliability and functional safety requirements on all aspects of the SOC lifecycle: design, silicon bring-up, volume production, and particularly in-system functional safety. Today's automotive safety critical chips need multiple insystem self-test modes, such as power-on self-test and repair, periodic in-field self-test, advanced error correction, etc. This tutorial will cover these specific in-system modes and the benefits of selecting ISO 26262 certified solutions to ensure standardized functional safety requirements, while accelerating time to market for automotive SOCs.