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ON current improvement techniques for double gate-tunnel field effect transistor

机译:双栅隧道场效应晶体管的导通电流改善技术

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The present design describes the behavior of drain current of DG-TFET with different parameter like gate insulator dielectric, its thickness and silicon body thickness. An improved ON current is archived using optimized device parameter, ON current as high as 0.18 mA and off current of the order of 10-19 A have been archived and a instantaneous sub threshold slope of as low as 16 mV/dec has been observed which is one of the reason why TFET could replace MOSFET. The simulation has been carried out with non-local barrier tunneling model using Synopsys TCAD Tool. A Huge ION/Ioff ratio of more than1014 is obtained for 50 nm channel length DG-TFET. So Tunnel FET can be a promising candidate for low-standby low-power switching performance.
机译:本设计描述了具有不同参数的DG-TFET漏极电流的行为,例如栅极绝缘体电介质,其厚度和硅体厚度。使用优化的设备参数可存储改善的导通电流,已归档的导通电流高达0.18 mA,截止电流约为10 -19 A,瞬时子阈值斜率低至16观察到mV / dec,这是TFET可以代替MOSFET的原因之一。已使用Synopsys TCAD工具使用非局部障碍隧道模型进行了仿真。对于50 nm沟道长度DG-TFET,获得的I ON / Ioff比率大于10 14 。因此,隧道FET可以成为低待机低功耗开关性能的有希望的候选者。

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