Electrical Engineering and Electronics, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan;
Electrical Engineering and Electronics, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan;
Electrical Engineering and Electronics, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan;
Electrical Engineering and Electronics, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan;
artificial satellites; circuit reliability; power electronics; radiation hardening (electronics); space vehicle electronics;
机译:在没有拟合参数的情况下计算高压卫星轨道下单次事件烧毁失败率
机译:SIC电源MOSFET器件中的单一事件燃尽硬化方法和评估
机译:基于SiC的功率器件中单事件燃耗的重离子迁移建模
机译:卫星电力系统中高压装置的单事件烧坏故障率的制定
机译:多个超导功率器件的集成低温系统的组合电热模型
机译:柔性交流传输系统装置的应用与控制用于可再生集成电网的电压稳定性增强:全面评论
机译:卫星电力系统中高压装置单项烧坏率的公式