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A 1200-V, 60-A SiC MOSFET Multichip Phase-Leg Module for High-Temperature,High-Frequency Applications

机译:适用于高温,高频应用的1200V,60A SiC MOSFET多芯片相腿模块

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摘要

In this paper, a high-temperature, high-frequency,rnwire-bond-based multichip phase-leg module was designed, fabricated,rnand fully tested. Using paralleled Silicon Carbide (SiC)rnMOSFETs, the module was rated at 1200 V and 60 A, and was designedrnfor a 25-kW three-phase inverter operating at a switchingrnfrequency of 70 kHz, and in a harsh environment up to 200 ◦C,rnfor aircraft applications. To this end, the temperature-dependentrncharacteristics of the SiC MOSFET were first evaluated. The resultsrndemonstrated the superiority of the SiC MOSFET in bothrnstatic and switching performances compared to Si devices, butrnmeanwhile did reveal the design tradeoff in terms of the device’srngate oxide stability. Various high-temperature packaging materialsrnwere then extensively surveyed and carefully selected for thernmodule to sustain the harsh environment. The electrical layoutrnof the module was also optimized using a modeling and simulationrnapproach, in order to minimize the device parasitic ringingrnduring high-speed switching. Finally, the static and switching performancesrnof the fabricated module were tested, and the 200 ◦Crncontinuous operation of the SiC MOSFETs was verified.
机译:本文设计,制作,测试了一种高温,高频,基于引线键合的多芯片相脚模块。使用并联的碳化硅(SiC)MOSFET,该模块的额定电压为1200 V和60 A,并且是为25 kW三相逆变器设计的,该逆变器在70 kHz的开关频率下以及在高达200°C的恶劣环境中工作,适用于飞机应用。为此,首先评估了SiC MOSFET随温度变化的特性。该结果证明了SiC MOSFET在静态和开关性能​​方面均优于Si器件,但同时也揭示了在器件的栅极氧化物稳定性方面的设计折衷。然后,对各种高温包装材料进行了广泛的调查并仔细选择了模块,以承受恶劣的环境。还使用建模和仿真方法对模块的电气布局进行了优化,以最大程度地减少高速开关期间的器件寄生振铃。最后,测试了所制造模块的静态和开关性能​​,并验证了SiC MOSFET在200℃连续工作。

著录项

  • 来源
  • 会议地点 Blacksburg VA(US)
  • 作者单位

    Bradley Department of Electrical and Computer Engineering, Center for Power ElectronicsSystems (CPES), Blacksburg,VA24061 USA e-mail: zchen07@vt.edu;

    Department of Material Science and Engineering, Centerfor Power Electronics Systems (CPES), Virginia Polytechnic Institute and StateUniversity, Blacksburg, VA 24061 USA (e-mail: yiyingy@vt.edu).;

    Bradley Department of Electrical and Computer Engineering, Center for Power ElectronicsSystems (CPES), Blacksburg,VA24061 USA dushan@vt.edu;

    Department of Electrical Engineering, The Universityof Texas at Dallas, Dallas, TX 75080 USA (e-mail: k.raja@utdallas.edu).;

    Bradley Department of Electrical and Computer Engineering, Center for Power ElectronicsSystems (CPES), Blacksburg,VA24061 USA kdtn@vt.edu;

    Bradley Department of Electrical and Computer Engineering, Center for Power ElectronicsSystems (CPES), Blacksburg,VA24061 USA mattavelli@ieee.org;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Device characteristics; gate oxide stability; hightemperature packaging; SiC MOSFET;

    机译:器件特性;栅极氧化稳定性;高温封装; SiC MOSFET;

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