Key Lab. of Adv. Display Syst. Applic., Shanghai Univ., Shanghai, China;
assembling; cracks; electronics packaging; gold; scanning electron microscopy; silicon; silver compounds; thermal stress cracking; tin compounds; Sn-Ag-Cu; VACNF-SAC305 solder joints; assembly process; crack propagation delay; dye analysis; electronic packaging industry; pry analysis; scanning electron microscopy observation; silicon-gold pad; solder joint structure; solder joint thermal fatigue resistance; thermal cycling test; thermal fatigue life; transfer process; vertically-aligned carbon nanofibres; Carbon; Fatigu;
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机译:空气合成:使用空气直流等离子体生长垂直排列的碳纳米纤维