首页> 外文会议>2012 International Conference on Enabling Science and Nanotechnology >Fabrication of 20 nm deep silicon dioxide channel using electron beam lithography for manipulation of DNA molecules
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Fabrication of 20 nm deep silicon dioxide channel using electron beam lithography for manipulation of DNA molecules

机译:使用电子束光刻技术处理DNA分子,制造20 nm深的二氧化硅通道

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Recent advances in micro and nano-scale fabrication technologies have allowed the fabrication of fluidic channels with a characteristic dimension on the order of tens of nanometers [1, 2]. This nano-scale channel is used for DNA mapping [3–7] and separation [8–13] and single biomolecule manipulation. The depth and anisotropically of these nano-channel play an important role in device performance. So, many efforts are performed to fabricate the channels with various techniques. In this paper, silicon dioxide (SiO2) nano-channel for DNA molecule manipulation are proposed and fabricated. The fabrication processes of this dielectric SiO2 nano-channel are including the combination of wet anisotropic etching, Electron Beam Lithography (EBL) and plasma etching (RIE). At first, Si was cleaned in a wet chemical etch process (standard cleaning processes), using RCA cleaning method. This is followed with thermal oxidation to achieve SiO2 with desired thickness. The rectangle reservoirs was patterned by photolithography technique. The reservoirs on SiO2 were created with wet etching (HF; H2O, 2:50), as can be seen in figure 1. For making nano-channel electron beam lithography(EBL) was used. In order to get channel, an electron-beam writer has been used to drill channel on a 300-nm thick poly methyl methacrylate (PMMA) layer coated on SiO2/Si substrate. After the PMMA development, the remaining PMMA on the silicon substrate serves as mask for the RIE process. In this process, RIE facility (Oxford Instruments, PlasmaLab 80 Plus) has been utilized in order to fabricate the SiO2 nano-scale of etch depth 20 nm. The process parameters are: CHF3 flow rate of 25 sccm, Ar flow rate of 25 sccm, process pressure of 10 mTorr, and incident rf power of 150 W. Figure 1 shows the reservoirs which have been created by photolithography and wet etching on SiO2 Surface. The dimension-nof the reservoir is about 3mm×3mm. Figure 2 is the SEM image of nano-channel that has been fabricated between reservoirs. The channel length and width are 1.5 mm and 1.3 μm, respectively. AFM in figure 3 shows the depth of SiO2 etched channel is about 20 nm which is sufficient for Lambda DNA stretching. Figure 3 (b) shows the etched profile of nano-channel, which displays that it is almost anisotropic. The fabrication processes of nano-channel are shown in figure 4. In conclusion, we have shown a fabrication processes of nano-channel between two reservoirs. It was demonstrated that by combination of various etching and lithography techniques could achieve 1.5 mm length and 20 nm deep dielectric channel which is appropriate for biology applications. It is suggested that the fabricated nano-channel dimension is suitable for stretching of Lambda DNA, since it''s depth should not be larger than twice the radius of gyration (700 nm) DNA.
机译:微米和纳米级制造技术的最新进展已允许制造特征尺寸在几十纳米级别的流体通道[1、2]。此纳米级通道用于DNA定位[3-7]和分离[8-13]和单个生物分子操纵。这些纳米通道的深度和各向异性在器件性能中起着重要作用。因此,进行了许多努力来利用各种技术来制造通道。本文提出并制备了用于DNA分子操纵的二氧化硅(SiO 2 )纳米通道。该介电SiO 2 纳米通道的制造工艺包括湿法各向异性蚀刻,电子束光刻(EBL)和等离子蚀刻(RIE)的组合。首先,使用RCA清洗方法在湿式化学蚀刻工艺(标准清洗工艺)中清洗Si。然后进行热氧化,以达到所需厚度的SiO 2 。矩形容器通过光刻技术形成图案。 SiO 2 上的储层是通过湿法刻蚀(HF; H 2 O,2:50)创建的,如图1所示。用于制造纳米通道电子使用束光刻(EBL)。为了获得通道,已经使用电子束记录器在涂覆在SiO 2 / Si衬底上的300 nm厚的聚甲基丙烯酸甲酯(PMMA)层上钻出通道。在PMMA开发之后,硅基板上剩余的PMMA充当了RIE工艺的掩模。在此过程中,已利用RIE设备(Oxford Instruments,PlasmaLab 80 Plus)制造了蚀刻深度为20 nm的SiO 2 纳米级。工艺参数为:CHF 3 流量为25 sccm,Ar流量为25 sccm,工艺压力为10 mTorr,入射射频功率为150W。图1显示了已创建的储层通过光刻和湿蚀刻在SiO 2 表面上进行。容器的尺寸n约为3mm×3mm。图2是在储层之间制作的纳米通道的SEM图像。通道的长度和宽度分别为1.5 mm和1.3μm。图3中的AFM显示SiO 2 蚀刻通道的深度约为20 nm,足以进行Lambda DNA拉伸。图3(b)显示了纳米通道的蚀刻轮廓,表明它几乎是各向异性的。纳米通道的制造过程如图4所示。总而言之,我们已经展示了两个储层之间纳米通道的制造过程。结果表明,通过各种蚀刻和光刻技术的结合,可以实现1.5毫米长和20纳米深的介电通道,适用于生物学应用。建议制造的纳米通道尺寸适合拉姆达DNA的拉伸,因为它的深度不应大于回转半径(700 nm)DNA的两倍。

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