首页> 外文会议>2012 IEEE 26th International Parallel and Distributed Processing Symposium Workshops amp; PhD Forum >A Power and Cluster-Aware Technology Mapping and Clustering Scheme for Dual-VT FPGAs
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A Power and Cluster-Aware Technology Mapping and Clustering Scheme for Dual-VT FPGAs

机译:适用于双VT FPGA的功耗和群集感知技术映射和群集方案

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In this paper, we present a technology mapping and clustering tool for leakage power reduction in FPGAs with programmable, dual-VT logic blocks. The use of Reverse Back Bias (RBB) circuit techniques is recognized as one of the more promising strategies in mitigating leakage power, a critical problem in circuits deploying deep submicron process technologies. FPGAs with the ability to adjust fabric VT through RBB offer the potential of reducing leakage power with minimal or no sacrifice to circuit speed. Today, Altera's Stratix line of FPGAs deploy a similar strategy, but with optimizations limited to the post-P&R stage. We present a novel two-stage technology mapping (RBBMap) and logic block packing (RBBPack) tool that is free from clustering constraints limiting the post-P&R method, and moves RBB optimizations upwards to the technology mapping level. Using the baseline technology mapping tool Emap, our tools generate an average of 70.95% savings in logic block leakage power and 28.30% savings in total energy consumption.
机译:在本文中,我们介绍了一种技术映射和群集工具,用于在具有可编程双VT逻辑模块的FPGA中降低泄漏功率。反向反向偏置(RBB)电路技术的使用被公认为是减轻泄漏功率的最有前途的策略之一,泄漏功率是部署深亚微米工艺技术的电路中的关键问题。具有通过RBB调整结构VT的能力的FPGA具有减少泄漏功率的潜力,而对电路速度的影响很小或没有。如今,Altera的Stratix FPGA系列采用了类似的策略,但优化仅限于P&R后阶段。我们提出了一种新颖的两阶段技术映射(RBBMap)和逻辑块打包(RBBPack)工具,该工具没有限制后P&R方法的聚类约束,并将RBB优化向上移动到了技术映射级别。使用基准技术映射工具Emap,我们的工具平均可节省70.95%的逻辑块泄漏功率和28.30%的总能耗。

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