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Electrical performance of via transitions in the presence of overlapping anti-pads

机译:防焊盘重叠时通孔过渡的电气性能

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摘要

The electrical performance of vias in multilayer PCBs is investigated. In particular the resonance effect due to overlapping anti-pads is characterized and an analytical formulation based on the dimensions of the cavity formed by the anti-pads and the vias is used to predict such a resonance. A prototype board is fabricated and measured results confirm the predicted results obtained from 3D electromagnetic simulation.
机译:研究了多层PCB中通孔的电气性能。特别地,表征了由于重叠的抗焊盘而引起的共振效应,并且基于由抗焊盘和通孔形成的腔的尺寸的分析公式被用于预测这种共振。制作了原型板,测量结果证实了从3D电磁仿真获得的预测结果。

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