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Study on creep fatigue behaviour of soft solders die attach for power package applications

机译:用于功率封装应用的软焊料芯片连接的蠕变疲劳行为研究

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Soft solder die attach is a widely used process for power and high-reliability automotive devices because soft solder has excellent heat-dissipation properties and outstanding robustness against delamination compared to traditional epoxy die attach. However, the creep-fatigue failure is one typical failure mechanism for solder material under thermal cycling. So it is essential to to understand the solder failure due to soft solder creep fatigue behavior. In this work, tensile creep tests for two soft solders, solder A and B, have been conducted at various temperatures and stress levels using a Dynamic Mechanical Analyzer (DMA). Creep constitutive models were developed and the material constants of the model were determined based on experimental results for both solders. The creep constitutive models were implemented in finite element analysis (FEA) to investigate the creep behavior of solder in the power packages for the evaluation of package reliability. Results show that solder A has better creep resistance than solder B, which indicates that the package with using solder A should have higher creep fatigue reliability than package with using solder B when subjected to thermal cycling. The storage modulus, liquidus temperature/solidus temperature for two types of solders were also measured by DMA and Differential Scanning Calorimetry (DSC), respectively.
机译:软焊料管芯附着是功率和高可靠性汽车设备广泛使用的工艺,因为与传统的环氧树脂管芯附着相比,软焊料具有出色的散热性能和出色的抗分层性。然而,蠕变疲劳失效是热循环下焊料材料的一种典型失效机理。因此,必须了解由于软焊料蠕变疲劳行为而导致的焊料失效。在这项工作中,已经使用动态机械分析仪(DMA)在各种温度和应力水平下对两种软焊料A和B进行了拉伸蠕变测试。建立了蠕变本构模型,并根据两种焊料的实验结果确定了模型的材料常数。在有限元分析(FEA)中实现了蠕变本构模型,以研究功率封装中焊料的蠕变行为,以评估封装的可靠性。结果表明,焊料A的抗蠕变性比焊料B更好,这表明在进行热循环时,使用焊料A的封装应比使用焊料B的封装具有更高的蠕变疲劳可靠性。还分别通过DMA和差示扫描量热法(DSC)测量了两种类型的焊料的储能模量,液相线温度/固相线温度。

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