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Cu-Sn and Ni-Sn transient liquid phase bonding for die-attach technology applications in high-temperature power electronics packaging

机译:Cu-Sn和Ni-Sn瞬态液相键合,用于高温功率电子封装中的芯片连接技术应用

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摘要

Power electronics modules in electric vehicles and hybrid electric vehicles, particularly those containing next-generation power semiconductor devices such as silicon carbide and gallium nitride are operated at high temperatures exceeding 200 °C. Consequently, the reliability requirements for such modules have become highly stringent and new packaging materials and technologies are required to meet the demands of power electronic modules. Some good candidates for high temperature applications include high-temperature solders such as Au-20Sn, Ag or Cu sinter pastes, and transient liquid phase (TLP) bonding materials. In particular, the TLP bonding technology is suitable for use in high temperature environments owing to its low cost and simplicity of the bonding process. In this study, the feasibility of Cu-Sn and Ni-Sn TLP bonding technologies as die-attach methods for power electronics packaging applications is examined. The results of the study indicate that the Cu-Sn and Ni-Sn TLP bonding processes transform the joints fully into Cu_6Sn_5/Cu_3Sn and Ni_3Sn_4 intermetallic compounds (IMCs), respectively. Further, the mechanical strength and reliability of the two TLP bonding joints are reduced owing to the formation of brittle IMCs.
机译:电动车辆和混合电动车辆中的功率电子模块,尤其是包含下一代功率半导体器件(例如碳化硅和氮化镓)的功率电子模块,在超过200°C的高温下工作。因此,对于这种模块的可靠性要求变得非常严格,并且需要新的包装材料和技术来满足电力电子模块的需求。一些适用于高温应用的良好候选材料包括高温焊料(例如Au-20Sn,Ag或Cu烧结膏)和瞬态液相(TLP)粘结材料。特别地,由于TLP键合技术的低成本和键合过程的简单性,其适合在高温环境中使用。在这项研究中,研究了铜-锡和镍-锡TLP键合技术作为电力电子封装应用中的芯片附着方法的可行性。研究结果表明,Cu-Sn和Ni-Sn TLP键合过程分别将接头完全转变为Cu_6Sn_5 / Cu_3Sn和Ni_3Sn_4金属间化合物(IMC)。此外,由于脆性IMC的形成,两个TLP接合接头的机械强度和可靠性降低。

著录项

  • 来源
    《Journal of materials science》 |2017年第11期|7827-7833|共7页
  • 作者单位

    Welding and Joining R&D Group, Korea Institute of Industrial Technology (KITECH), 156 Gaetbeol-ro,Yeonsu-gu, Incheon 21999, South Korea,Department of Metallurgical Engineering, Inha University,Incheon 22212, South Korea;

    Department of Metallurgical Engineering, Inha University,Incheon 22212, South Korea;

    Welding and Joining R&D Group, Korea Institute of Industrial Technology (KITECH), 156 Gaetbeol-ro,Yeonsu-gu, Incheon 21999, South Korea,Critical Materials and Semiconductor Packaging Engineering, University of Science and Technology (UST),217 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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