首页> 外文会议>2010 27th International Conference on Microelectronics Proceedings >Benchmarking of HBT models for InP based DHBT modeling
【24h】

Benchmarking of HBT models for InP based DHBT modeling

机译:基于InP的DHBT建模的HBT模型基准测试

获取原文
获取原文并翻译 | 示例

摘要

In this paper the modeling results of a given InP/InGaAs/InP DHBT technology (0.7×7 µm emitter area) have been shown with two advanced compact models, HICUM L0 and Agilent HBT. Shortcomings of these models have been pointed out and their suitability for modeling these high frequency devices has been discussed.
机译:本文使用两种先进的紧凑型模型HICUM L0和Agilent HBT展示了给定的InP / InGaAs / InP DHBT技术(0.7×7 µm发射极面积)的建模结果。指出了这些模型的缺点,并讨论了它们对这些高频设备建模的适用性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号