Top-Down Reuse for Multi-level Testing

摘要

Multi-Level Testing is an emerging approach for test level integration through reuse. Its principal instrument, multi-level test cases, has only been considered in the context of bottom-up reuse to date. This test level integration strategy leads to excellent test effort reductions for embedded systems. However, bottom-up reuse is incapable of dealing with components featuring complex dynamic behavior. Top-down reuse is a novel test level integration approach that enables the reuse of test cases from higher test levels at lower test levels even in presence of complex dynamic behavior. With this practice, multi-level testing becomes applicable for a large set of new systems that can now benefit from great test effort reductions. In addition, test level design at the top test levels leads to system- and hence customer-oriented testing.