首页> 外文会议>14th annual Pan Pacific microelectronics symposium and tabletop exhibition >STUDY OF APPLICATION AND RELIABILITY OF LOW MELTING POINT Sn-Zn-Bi-In-P SYSTEM LEAD-FREE ALLOYS
【24h】

STUDY OF APPLICATION AND RELIABILITY OF LOW MELTING POINT Sn-Zn-Bi-In-P SYSTEM LEAD-FREE ALLOYS

机译:低熔点Sn-Zn-Bi-In-P系无铅合金的应用及可靠性研究

获取原文
获取原文并翻译 | 示例

摘要

The new Sn-Zn-Bi-In-P lead-free solder has goodrnsolderability, low melting point and the same reflowrnprofile as the Sn-37Pb eutectic solder. The bondingrnstrength of the Sn-Zn-Bi-In-P solder joint is 1.5 timesrnhigher than that of the Sn-37Pb solder joint. Afterrnthermal fatigue, the fatigue life of the former is 25%rnmore than that of the latter. The microstructure andrncomposition of the solder joint interface are also studied.rnA Zn-rich layer is found at the interface which canrnprevent the diffusion of Sn and Cu atoms, consequentlyrndecrease the thickness of the intermetallic compoundrnlayer. The results of EDX and TEM indicate that thernintermetallic compound is Cu5Zn8. The solder paste hasrnbeen produced and tested on the production line tornevaluate its performance.
机译:新型Sn-Zn-Bi-In-P无铅焊料具有良好的可焊性,低熔点和与Sn-37Pb低共熔焊料相同的回流曲线。 Sn-Zn-Bi-In-P焊点的结合强度比Sn-37Pb焊点的结合强度高1.5倍。在热疲劳后,前者的疲劳寿命比后者长25%。还研究了焊点界面的微观结构和组成。在界面处发现了富锌层,可防止Sn和Cu原子的扩散,从而减小金属间化合物层的厚度。 EDX和TEM的结果表明,金属间化合物为Cu5Zn8。已经在生产线上生产并测试了焊膏,以评估其性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号