首页> 外国专利> Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method

Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method

机译:非接触式无损检测系统、信号处理装置、非接触式无损检测方法

摘要

A non-contact non-destructive inspection system according to an embodiment includes a sensor, a velocity detection unit, and a damage detection unit. The sensor detects a second elastic wave emitted to a medium surrounding an inspection object due to a first elastic wave propagating through the inspection object. The velocity detection unit detects a velocity of the first elastic wave based on a wavefront angle of the second elastic wave and a velocity of the second elastic wave. The damage detection unit detects damage to the inspection object based on the velocity of the first elastic wave.
机译:实施例所述的非接触式无损检测系统包括传感器、速度检测单元和损伤检测单元。由于第一弹性波在检测对象中传播,传感器检测到发射到检测对象周围介质的第二弹性波。速度检测单元根据第二弹性波的波前角和第二弹性波的速度检测第一弹性波的速度。损伤检测单元根据第一弹性波的速度检测对象的损伤。

著录项

  • 公开/公告号US11879815B2;US2024011879815B2;US11879815B2;US11879815

    专利类型

  • 公开/公告日2024-01-23

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA TOSHIBA;

    申请/专利号US17651602;US202200017651602;US202217651602A;US202217651602

  • 发明设计人

    申请日2022-02-18

  • 分类号G01M5;

  • 国家

  • 入库时间 2024-06-15 00:09:32

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