Integrated circuit and test method for integrated circuit

摘要

Provided is an integrated circuit and a test method for an integrated circuit. The integrated circuit includes at least one first branch and at least one second branch. The first branch includes at least one first capacitor. The first end of the first branch is electrically connected to the first end of the second branch, and the second end of the first branch is not connected to the second end of the second branch, to conduct a low-frequency test. The low-frequency test includes application of a low-frequency test signal between the first end of the first branch and the second end of the first branch to test the first branch.